DSpace at KOASAS: Formation of defects in HgCdTe photodiodes induced by thermal stress

DSpace at KOASAS

College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Formation of defects in HgCdTe photodiodes induced by thermal stress

Cited 0 time in webofscience

Cited 0 time in scopus

Hit : 283
Download : 0

Export

Lee, Hee Chul researcher

Publisher: U.S. Workshop for Physics and Chemistry of II–VI Materials

Issue Date: 2002-11

Language: English

Citation: 2002 U.S. Workshop for Physics and Chemistry of II–VI Materials, pp.0 - 0

URI: http://hdl.handle.net/10203/131877

Appears in Collection: EE-Conference Papers(학술회의논문)

Files in This Item: There are no files associated with this item.

Display Full Item Record

qr_code

트윗하기

KOASAS

Knowledge Service Development Team, KAIST 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea. T. 82-42-350-4493 Email. koasas@kaist.ac.kr
Copyright © 2016. Korea Advanced Institute of Science and Technology. All Rights Reserved.

KOASAS

KOASAS

Browse

Formation of defects in HgCdTe photodiodes induced by thermal stress

KOASAS

Communities & Collections