Investigation of Fatigue Characteristics of Domain in Pb(Zr0.52Ti0.48)O3(PZT) Thin Films using Atomic Force Microscopy(AFM)
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | No, Kwangsoo | - |
| dc.contributor.author | Song, Han Wook | - |
| dc.date.accessioned | 2013-03-16T10:08:19Z | - |
| dc.date.available | 2013-03-16T10:08:19Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2001-01-01 | - |
| dc.identifier.citation | FERAM, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/130178 | - |
| dc.language | ENG | - |
| dc.title | Investigation of Fatigue Characteristics of Domain in Pb(Zr0.52Ti0.48)O3(PZT) Thin Films using Atomic Force Microscopy(AFM) | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | FERAM | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.contributor.localauthor | No, Kwangsoo | - |
| dc.contributor.nonIdAuthor | Song, Han Wook | - |
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