Real-space electronic structure calculations of native defects in SiO_2
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jin, YG | - |
| dc.contributor.author | Chang, Kee-Joo | - |
| dc.date.accessioned | 2013-03-16T09:47:10Z | - |
| dc.date.available | 2013-03-16T09:47:10Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1999-11 | - |
| dc.identifier.citation | 2nd Korea-Japan Joint Workshop on Electronic Structure Calculations, v., no., pp.29 - 29 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/130018 | - |
| dc.language | ENG | - |
| dc.title | Real-space electronic structure calculations of native defects in SiO_2 | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 29 | - |
| dc.citation.endingpage | 29 | - |
| dc.citation.publicationname | 2nd Korea-Japan Joint Workshop on Electronic Structure Calculations | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Chang, Kee-Joo | - |
| dc.contributor.nonIdAuthor | Jin, YG | - |
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