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Volumetric phase-measuring interferometer for three-dimensional coordinate metrology Kim, Seung-Woo; Rhee, H.-G.; Chu, J.-Y., PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, v.27, no.2, pp.205 - 215, 2003 |
멀티레터레이션에 근거한 점회절을 이용한 대영역 표면형상 측정 = Large scale surface profile measurement using point diffraction based on multilaterationlink 김병창; Kim, Byoung-Chang; et al, 한국과학기술원, 2003 |
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