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Inspection system for microelectronics BGA package using wavelength scanning interferometry Kang C.M.; Woo H.G.; Cho, Hyungsuck; Hahn J.W.; Lee J.Y., Optomechatronic Systems II, pp.74 - 85, International Society for Optical Engineering (SPIE), 2001-10-29 |
Laser weld keyhole dynamics Cho M.H.; Farson D.; Zoofan B.; Lee J.Y.; Yoo C.D., Trends in Welding Research: Proceedings of the 6th International Conference, pp.112 - 117, 2002-04-15 |
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