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Browse "Dept. of Mechanical Engineering(기계공학과)" by Author Ghim Y.-S.

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Showing results 1 to 4 of 4

1
Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures

Joo W.-D.; You J.; Ghim Y.-S.; Kim, Seung-Woo, Interferometry XIV: Techniques and Analysis, 123, 2008-08-11

2
Dispersive white-light interferometry for 3-D inspection of thin-film layers of flat panel displays

Ghim Y.-S.; You J.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection V, 123, 2007-06-18

3
Low coherence interferometry for 3-D measurements of microelectronics packaging and integration

Kim, Seung-Woo; Ghim Y.-S., Optoelectronic Devices and Integration, v.5644, pp.429 - 443, 2004-11-08

4
Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry

Ghim Y.-S.; You J.; Kim, Seung-Woo, Thin-Film Coatings for Optical Applications IV, pp.6674, 123, 2007-08-29

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