Showing results 1 to 2 of 2
Advancement of white-light interferometry for 3-D profile metrology of micro-structured surfaces Kim, Seung-Woo; Ghim, YS, kspe, pp.39 - 46, 2005-10 |
Fast, precise, tomographic measurements of thin films Ghim, YS; Kim, Seung-Woo, APPLIED PHYSICS LETTERS, v.91, no.9, pp.E63 - E63, 2007-08 |
Discover