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High speed 3D surface profile without axial scanning: dual-detection confocal reflectance microscopy Lee, Dongryoung; Kim, Young-Duk; Gweon, Dae-Gab; Yoo, Hongki, MEASUREMENT SCIENCE & TECHNOLOGY, v.25, no.12, 2014-12 |
Multipoint scanning dual-detection confocal microscopy for fast 3D volumetric measurement Lee, D; Gweon, Dae-Gab; Yoo, Hongki, JOURNAL OF MICROSCOPY, v.270, no.2, pp.200 - 209, 2018-05 |
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