Showing results 1 to 4 of 4
Design and analysis of a cross-type structured-illumination confocal microscope for high speed and high resolution Kim, Young-Duk; Ahn, Myoung-Ki; Kim, Tae-Joong; Yoo, Hong-Ki; Gweon, Dae-Gab, MEASUREMENT SCIENCE & TECHNOLOGY, v.23, no.10, 2012-10 |
Design, analysis and aberration correction of high-resolution beam-scanning stimulated emission depletion microscopy = 빔 주사 방식 고분해능 STED 현미경의 설계, 분석 및 수차 보정에 관한 연구link Yoo, Hong-Ki; 유홍기; et al, 한국과학기술원, 2007 |
Dual-detection confocal fluorescence microscopy: fluorescence axial imaging without axial scanning![]() Lee, Dong-Ryoung; Kim, Young-Duk; Gweon, Dae-Gab; Yoo, Hong-Ki, OPTICS EXPRESS, v.21, no.15, pp.17839 - 17848, 2013-07 |
Monte carlo 방법을 이용한 공초점 주사 현미경의 오차분석과 공차 할당에 관한 연구 = Error analysis and tolerance allocation for confocal scanning microscope, using Monte Carlo Methodlink 유홍기; Yoo, Hong-Ki; et al, 한국과학기술원, 2003 |
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