Browse "Dept. of Mechanical Engineering(기계공학과)" by Subject THICKNESS

Showing results 16 to 22 of 22

16
Nondestructive evaluation of multilayered paint films in ambient atmosphere using terahertz reflection spectroscopy

Choi, Jindoo; Kwon, Won Sik; Kim, Kyung-Soo; Kim, Soohyun, NDT & E INTERNATIONAL, v.80, pp.71 - 76, 2016-06

17
Prediction of crack length and crack growth rate of adhesive joints by a piezoelectric method

Hwang, HY; Kim, BJ; Chin, WS; Kim, HS; Lee, Dai Gil, JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, v.19, no.12, pp.1081 - 1111, 2005

18
Quantitative Analysis of Monosaccharide Concentration Using Terahertz Time-Domain Spectroscopy in Ambient Atmosphere

Lee, Jinwoo; Kim, Soohyun, IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.70, 2021

19
Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser

Joo, Ki-Nam; Kim, Seung-Woo, OPTICS LETTERS, v.32, no.6, pp.647 - 649, 2007-03

20
Surface decorated La(0.43)Ca(0.37)Ni(0.06)Ti(0.94)O(3-d)as an anode functional layer for solid oxide fuel cell applications

Jeong, HyeonGwon; Kim, Doyeub; Sharma, Bharat; Noh, Jong Hyeok; Lee, Kang Taek; Myung, Jae-ha, KOREAN JOURNAL OF CHEMICAL ENGINEERING, v.37, no.8, pp.1440 - 1444, 2020-08

21
Three-dimensional confocal reflectance microscopy for surface metrology

Kim, Chang-Soo; Yoo, Hongki, MEASUREMENT SCIENCE AND TECHNOLOGY, v.32, no.10, 2021-10

22
Wide-Field Three-Dimensional Depth-Invariant Cellular-Resolution Imaging of the Human Retina

Lee, ByungKun; Jeong, Sunhong; Lee, Joosung; Kim, Tae Shik; Braaf, Boy; Vakoc, Benjamin J. J.; Oh, Wang-Yuhl, SMALL, v.19, no.11, 2023-03

rss_1.0 rss_2.0 atom_1.0