Showing results 3 to 4 of 4
Low coherence interferometry for 3-D measurements of microelectronics packaging and integration Kim, Seung-Woo; Ghim Y.-S., Optoelectronic Devices and Integration, v.5644, pp.429 - 443, 2004-11-08 |
Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry Ghim Y.-S.; You J.; Kim, Seung-Woo, Thin-Film Coatings for Optical Applications IV, pp.6674, 123, 2007-08-29 |
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