Showing results 5 to 7 of 7
Nanotopographical imaging using a heated atomic force microscope cantilever probe Kim, K. J.; Park, K.; Lee, Jungchul; Zhang, Z. M.; King, W. P., SENSORS AND ACTUATORS A-PHYSICAL, v.136, no.1, pp.95 - 103, 2007-05 |
Note: Precision viscosity measurement using suspended microchannel resonators Lee, I.; Park, K.; Lee, Jungchul, REVIEW OF SCIENTIFIC INSTRUMENTS, v.83, no.11, 2012-11 |
Three-Dimensional Finite Element Anlaysis for Industrial Hollow Section Extrusion of Multiply-Connected Sections Using Mismatching Refinement Yang, Dong-Yol; Park, K.; Lee, Y. K.; Lee, D. H., 6th ICTP , pp.1807 - 1812, 1999 |
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