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Application of sensitivity analysis for the design of six-degree-of-freedom measurement system Kim, Jong-Ahn; Bae, Eui Won; Kim, Soohyun; Kwak, Yoon Keun, OPTICAL ENGINEERING, v.40, no.12, pp.2837 - 2844, 2001-05 |
Application of sensitivity analysis for the design of six-degree-of-freedom measurement system Kim, Jong-Ahn; Bae, Eui Won; Kim, Soo Hyun; Kwak, Yoon Keun, Optical engineering : the journal of the Society of Photo-optical Instrumentation Engineers, v.40 no.12, pp.2837-2844, 2001-12 |
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