Showing results 8 to 15 of 15
Micro/nano-heater integrated cantilevers for micro/nano-lithography applications Lee, Dong-Weon; Oh, Il-Kwon, MICROELECTRONIC ENGINEERING, v.84, no.5-8, pp.1041 - 1044, 2007-05 |
Microcantilever hotplates with temperature-compensated piezoresistive strain sensors Goericke, Fabian; Lee, Jungchul; King, William P., SENSORS AND ACTUATORS A-PHYSICAL, v.143, no.2, pp.181 - 190, 2008-05 |
Microcantilever hotplates: Design, fabrication, and characterization Lee, Jungchul; King, William P., SENSORS AND ACTUATORS A-PHYSICAL, v.136, no.1, pp.291 - 298, 2007-05 |
Nanotopographical imaging using a heated atomic force microscope cantilever probe Kim, K. J.; Park, K.; Lee, Jungchul; Zhang, Z. M.; King, W. P., SENSORS AND ACTUATORS A-PHYSICAL, v.136, no.1, pp.95 - 103, 2007-05 |
Quantitative probing of tip-induced local cooling with a resistive nanoheater/thermometer Hamian, Sina; Yun, Jeonghoon; Park, Inkyu; Park, Keunhan, APPLIED PHYSICS LETTERS, v.109, no.25, 2016-12 |
Temperature-dependent thermomechanical noise spectra of doped silicon microcantilevers Lee, Jungchul; Goericke, Fabian; King, William P., SENSORS AND ACTUATORS A-PHYSICAL, v.145, pp.37 - 43, 2008-07 |
Thermal conduction from microcantilever heaters in partial vacuum Lee, Jungchul; Wright, Tanya L.; Abel, Mark R.; Sunden, Erik O.; Marchenkov, Alexei; Graham, Samuel; King, William P., JOURNAL OF APPLIED PHYSICS, v.101, no.1, 2007-01 |
Topography imaging with a heated atomic force microscope cantilever in tapping mode Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M.; King, William P., REVIEW OF SCIENTIFIC INSTRUMENTS, v.78, no.4, 2007-04 |
Discover