DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yun, Kwang-Seok | ko |
dc.contributor.author | Kim, Hong-Jeong | ko |
dc.contributor.author | Kwak, Juhyoun | ko |
dc.contributor.author | Joo, Segyeong | ko |
dc.contributor.author | Yoon, Euisik | ko |
dc.date.accessioned | 2013-03-16T08:44:21Z | - |
dc.date.available | 2013-03-16T08:44:21Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2000-07 | - |
dc.identifier.citation | 2000 International Microprocesses and Nanotechnology Conference (MNC2000), pp.72 - 73 | - |
dc.identifier.uri | http://hdl.handle.net/10203/129502 | - |
dc.language | English | - |
dc.publisher | MNC | - |
dc.title | Analysis of heavy-metal-ions using mercury microelectrodes and a solid-state reference electrode fabricated on a Si wafer | - |
dc.type | Conference | - |
dc.identifier.wosid | 000166793600034 | - |
dc.identifier.scopusid | 2-s2.0-84951946061 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 72 | - |
dc.citation.endingpage | 73 | - |
dc.citation.publicationname | 2000 International Microprocesses and Nanotechnology Conference (MNC2000) | - |
dc.identifier.conferencecountry | JA | - |
dc.identifier.conferencelocation | Tokyo | - |
dc.contributor.localauthor | Kwak, Juhyoun | - |
dc.contributor.localauthor | Yoon, Euisik | - |
dc.contributor.nonIdAuthor | Yun, Kwang-Seok | - |
dc.contributor.nonIdAuthor | Kim, Hong-Jeong | - |
dc.contributor.nonIdAuthor | Joo, Segyeong | - |
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