Optical properties of microcrystalline silicon determined by spectroscopic ellipsometry and photothermal deflection spectroscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jun K.H. | - |
| dc.contributor.author | Stiebig H. | - |
| dc.contributor.author | Carius R. | - |
| dc.date.accessioned | 2013-03-16T04:46:34Z | - |
| dc.date.available | 2013-03-16T04:46:34Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2002-04-02 | - |
| dc.identifier.citation | Amorphous and Heterogeneous Silicon Films 2002, v.715, no., pp.193 - 199 | - |
| dc.identifier.issn | 0272-9172 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/127575 | - |
| dc.language | ENG | - |
| dc.title | Optical properties of microcrystalline silicon determined by spectroscopic ellipsometry and photothermal deflection spectroscopy | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-0036920111 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 715 | - |
| dc.citation.beginningpage | 193 | - |
| dc.citation.endingpage | 199 | - |
| dc.citation.publicationname | Amorphous and Heterogeneous Silicon Films 2002 | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Jun K.H. | - |
| dc.contributor.nonIdAuthor | Stiebig H. | - |
| dc.contributor.nonIdAuthor | Carius R. | - |
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