X-ray laminographic application of lens-coupled CMOS detector for PCB inspection
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, H.K. | ko |
| dc.contributor.author | Jeon, S.C. | ko |
| dc.contributor.author | Cho, Gyuseong | ko |
| dc.contributor.author | Lim, S.-H. | ko |
| dc.date.accessioned | 2013-03-16T03:21:45Z | - |
| dc.date.available | 2013-03-16T03:21:45Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2001-11-04 | - |
| dc.identifier.citation | 2001 IEEE Nuclear Science Symposium Conference Record, pp.1620 - 1623 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/126950 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | X-ray laminographic application of lens-coupled CMOS detector for PCB inspection | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000178495800355 | - |
| dc.identifier.scopusid | 2-s2.0-0035554869 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1620 | - |
| dc.citation.endingpage | 1623 | - |
| dc.citation.publicationname | 2001 IEEE Nuclear Science Symposium Conference Record | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | San Diego, CA | - |
| dc.contributor.localauthor | Cho, Gyuseong | - |
| dc.contributor.nonIdAuthor | Kim, H.K. | - |
| dc.contributor.nonIdAuthor | Jeon, S.C. | - |
| dc.contributor.nonIdAuthor | Lim, S.-H. | - |
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