DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han J. | ko |
dc.contributor.author | Je M. | ko |
dc.contributor.author | Shin H. | ko |
dc.date.accessioned | 2013-03-16T03:15:16Z | - |
dc.date.available | 2013-03-16T03:15:16Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2002-04-08 | - |
dc.identifier.citation | Proceedings of The 2002 International Conference on Microelectronic Test Structures, pp.37 - 40 | - |
dc.identifier.uri | http://hdl.handle.net/10203/126872 | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Extraction method for substrate resistance of RF MOSFETs | - |
dc.type | Conference | - |
dc.identifier.wosid | 000182571600007 | - |
dc.identifier.scopusid | 2-s2.0-0037481724 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 37 | - |
dc.citation.endingpage | 40 | - |
dc.citation.publicationname | Proceedings of The 2002 International Conference on Microelectronic Test Structures | - |
dc.identifier.conferencecountry | IE | - |
dc.identifier.conferencelocation | Cork | - |
dc.contributor.localauthor | Shin H. | - |
dc.contributor.nonIdAuthor | Han J. | - |
dc.contributor.nonIdAuthor | Je M. | - |
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