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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

35nm CMOS FinFETs

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dc.contributor.authorChoi, Yang-Kyu-
dc.contributor.authorYang, Fu-Liang-
dc.contributor.authorChen, Haur-Ywh-
dc.contributor.authorChen, Fang-Cheng-
dc.contributor.authorChan, Yi-Lin-
dc.contributor.authorYang, Kuo-Nan-
dc.contributor.authorChen, Chih-Jian-
dc.contributor.authorTao, Hun-Jan-
dc.contributor.authorLiang, Mong-Song-
dc.contributor.authorHu, Chenming-
dc.date.accessioned2013-03-16T02:40:47Z-
dc.date.available2013-03-16T02:40:47Z-
dc.date.created2012-02-06-
dc.date.issued2002-06-
dc.identifier.citationIEEE, v., no., pp.104 - 105-
dc.identifier.urihttp://hdl.handle.net/10203/126585-
dc.languageENG-
dc.title35nm CMOS FinFETs-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage104-
dc.citation.endingpage105-
dc.citation.publicationnameIEEE-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorChoi, Yang-Kyu-
dc.contributor.nonIdAuthorYang, Fu-Liang-
dc.contributor.nonIdAuthorChen, Haur-Ywh-
dc.contributor.nonIdAuthorChen, Fang-Cheng-
dc.contributor.nonIdAuthorChan, Yi-Lin-
dc.contributor.nonIdAuthorYang, Kuo-Nan-
dc.contributor.nonIdAuthorChen, Chih-Jian-
dc.contributor.nonIdAuthorTao, Hun-Jan-
dc.contributor.nonIdAuthorLiang, Mong-Song-
dc.contributor.nonIdAuthorHu, Chenming-
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