Micromachined photoconductive electric field mapping probe for the measurement of picosecond pulse propagation

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dc.contributor.authorLee, Jongjooko
dc.contributor.authorLee, Heeseokko
dc.contributor.authorKim, Jounghoko
dc.date.accessioned2013-03-16T01:41:13Z-
dc.date.available2013-03-16T01:41:13Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2000-11-
dc.identifier.citation13th Annual Meeting. IEEE Lasers and Electro-Optics Society 2000 Annual Meeting (LEOS 2000), pp.41 - 42-
dc.identifier.issn1092-8081-
dc.identifier.urihttp://hdl.handle.net/10203/126138-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleMicromachined photoconductive electric field mapping probe for the measurement of picosecond pulse propagation-
dc.typeConference-
dc.identifier.wosid000165806400020-
dc.identifier.scopusid2-s2.0-0034481753-
dc.type.rimsCONF-
dc.citation.beginningpage41-
dc.citation.endingpage42-
dc.citation.publicationname13th Annual Meeting. IEEE Lasers and Electro-Optics Society 2000 Annual Meeting (LEOS 2000)-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationRio Grande-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorLee, Jongjoo-
dc.contributor.nonIdAuthorLee, Heeseok-
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