Structural phase transitions of Ge2Sb2Te5 cells with TiN electrodes using a homemade W heater tip

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The phase transitions of a Ge2Sb2Te5 cell with a volume of 20x20x0.1 mu m(3) were carried out by applying a reset pulse (10 V and 50 ns) and a subsequent set pulse (5 V and 300 ns) using a homemade W heater tip fabricated by focused ion beam lithography. The phase transformation from a crystalline state to an amorphous state was confirmed by measuring the I-V curves and observation with a cross-sectional transmission electron microscope both before and after applying the reset pulse. The electron diffraction pattern obtained from the transformed area clearly showed the amorphous state. The resistance value of the transformed amorphous area was two orders higher than that of the original crystalline phase. This difference in the resistance value between the reset and set states was maintained for 20 reset/set pulse cycles. It is expected that this experimental setup can be used to evaluate the fatigue behavior of Ge2Sb2Te5 cells with reset/set pulse cycles. (c) 2007 American Institute of Physics.
Publisher
AMER INST PHYSICS
Issue Date
2007-02
Language
English
Article Type
Article
Keywords

ATOMIC-FORCE MICROSCOPE; FOCUSED ION-BEAM; DATA-STORAGE; THIN-FILMS; CRYSTALLIZATION; MEMORY

Citation

APPLIED PHYSICS LETTERS, v.90, no.8, pp.141 - 156

ISSN
0003-6951
DOI
10.1063/1.2709617
URI
http://hdl.handle.net/10203/12578
Appears in Collection
MS-Journal Papers(저널논문)
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