Fabrication and Characterization PZT/TiO2/SiO2/SiNx/SiO2/Si structure of Acousto-optic Device using Piezoelectric Film

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 326
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorNo, Kwangsoo-
dc.contributor.authorLee, C-
dc.contributor.authorLee, CS-
dc.contributor.authorLiu, J-
dc.date.accessioned2013-03-15T23:50:21Z-
dc.date.available2013-03-15T23:50:21Z-
dc.date.created2012-02-06-
dc.date.issued2000-
dc.identifier.citationInternational Symposium on Integrated Ferroelectrics(ISIF), v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/125247-
dc.languageENG-
dc.publisherISIF-
dc.titleFabrication and Characterization PZT/TiO2/SiO2/SiNx/SiO2/Si structure of Acousto-optic Device using Piezoelectric Film-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameInternational Symposium on Integrated Ferroelectrics(ISIF)-
dc.identifier.conferencecountryGermany-
dc.identifier.conferencecountryGermany-
dc.contributor.localauthorNo, Kwangsoo-
dc.contributor.nonIdAuthorLee, C-
dc.contributor.nonIdAuthorLee, CS-
dc.contributor.nonIdAuthorLiu, J-
Appears in Collection
MS-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0