Astigmatism-corrected Flat-field XUV Spectrograph and its Aberration Analysis

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dc.contributor.authorNam, Chang Hee-
dc.contributor.authorChoi, IW-
dc.contributor.authorShin, HJ-
dc.contributor.authorLee, JU-
dc.date.accessioned2013-03-15T20:43:28Z-
dc.date.available2013-03-15T20:43:28Z-
dc.date.created2012-02-06-
dc.date.issued1996-
dc.identifier.citationIn Optics for Science and new Technology: 17th Congress of the International Commission for Optics, v., no., pp.1228 --
dc.identifier.urihttp://hdl.handle.net/10203/123685-
dc.languageENG-
dc.titleAstigmatism-corrected Flat-field XUV Spectrograph and its Aberration Analysis-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage1228-
dc.citation.publicationnameIn Optics for Science and new Technology: 17th Congress of the International Commission for Optics-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorNam, Chang Hee-
dc.contributor.nonIdAuthorChoi, IW-
dc.contributor.nonIdAuthorShin, HJ-
dc.contributor.nonIdAuthorLee, JU-
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PH-Conference Papers(학술회의논문)
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