DC Field | Value | Language |
---|---|---|
dc.contributor.author | Nam, Chang Hee | - |
dc.contributor.author | Choi, IW | - |
dc.contributor.author | Shin, HJ | - |
dc.contributor.author | Lee, JU | - |
dc.date.accessioned | 2013-03-15T20:43:28Z | - |
dc.date.available | 2013-03-15T20:43:28Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996 | - |
dc.identifier.citation | In Optics for Science and new Technology: 17th Congress of the International Commission for Optics, v., no., pp.1228 - | - |
dc.identifier.uri | http://hdl.handle.net/10203/123685 | - |
dc.language | ENG | - |
dc.title | Astigmatism-corrected Flat-field XUV Spectrograph and its Aberration Analysis | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1228 | - |
dc.citation.publicationname | In Optics for Science and new Technology: 17th Congress of the International Commission for Optics | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Nam, Chang Hee | - |
dc.contributor.nonIdAuthor | Choi, IW | - |
dc.contributor.nonIdAuthor | Shin, HJ | - |
dc.contributor.nonIdAuthor | Lee, JU | - |
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