DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Jong Jean | - |
dc.date.accessioned | 2013-03-15T18:23:09Z | - |
dc.date.available | 2013-03-15T18:23:09Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996 | - |
dc.identifier.citation | Proc. of the XV the Int'l Conf. on Raman Spectroscopy(John-Wiley and Sons), v., no., pp.936 - 937 | - |
dc.identifier.uri | http://hdl.handle.net/10203/122384 | - |
dc.language | ENG | - |
dc.title | Raman scattering from $F^+$-implanted Si | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 936 | - |
dc.citation.endingpage | 937 | - |
dc.citation.publicationname | Proc. of the XV the Int'l Conf. on Raman Spectroscopy(John-Wiley and Sons) | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Kim, Jong Jean | - |
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