DC Field | Value | Language |
---|---|---|
dc.contributor.author | 이귀로 | - |
dc.contributor.author | 김시호 | - |
dc.date.accessioned | 2013-03-15T15:29:23Z | - |
dc.date.available | 2013-03-15T15:29:23Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1995 | - |
dc.identifier.citation | 대한전자공학회 학술대회 , v., no., pp.209 - 210 | - |
dc.identifier.uri | http://hdl.handle.net/10203/120773 | - |
dc.language | KOR | - |
dc.publisher | 대한전자공학회 | - |
dc.title | Time Dependent Hot-Carrier-Induced Interface State Generation in Deep Submicron LDD nMOSFETs | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 209 | - |
dc.citation.endingpage | 210 | - |
dc.citation.publicationname | 대한전자공학회 학술대회 | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | 이귀로 | - |
dc.contributor.nonIdAuthor | 김시호 | - |
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