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An Overview of Non-Destructive Testing Methods for Integrated Circuit Packaging Inspection Aryan, Pouria; Sampath, Santhakumar; Sohn, Hoon, SENSORS, v.18, no.7, 2018-07 |
Ultrafast nonlinear ultrasonic measurement using femtosecond laser and modified lock-in detection Liu, Peipei; Yi, Kiyoon; Park, Yejun; Sohn, Hoon, OPTICS AND LASERS IN ENGINEERING, v.150, 2022-03 |
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