Showing results 1 to 3 of 3
Application of frequency domain ARX models and extreme value statistics to impedance-based damage detection Fasel, Timothy R.; Sohn, Hoon; Farrar, Charles R., the International Mechanical Engineering Congress and Exposition Winter Annual Meeting of the ASME, ASME, 2003-11 |
Damage detection using frequency domain ARX models and extreme value statistics Fasel, Timothy R.; Sohn, Hoon; Farrar, Charles R., the 21st International Modal Analysis Conference, IMAC, 2003-02 |
Piezoelectric active sensing using chaotic excitations Fasel, Timothy R.; Todd, Michael D.; Sohn, Hoon; Park, Gyuhae; Farrar, Charles R., Proceedings of 11th SPIE Conference on Smart Structures and Materials, SPIE, 2004-03-14 |
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