Design and strength evaluation of an anodically bonded pressurized cavity array for wafer-level MEMS packaging

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dc.contributor.authorGo, Jeung Sang-
dc.contributor.authorCho, Young-Ho-
dc.date.accessioned2013-03-15T12:43:16Z-
dc.date.available2013-03-15T12:43:16Z-
dc.date.created2012-02-06-
dc.date.issued1998-11-15-
dc.identifier.citationInter. Mechanical Engineering Congress and Exposition (IMECE '98),, v.66, no., pp.357 - 360-
dc.identifier.urihttp://hdl.handle.net/10203/119556-
dc.languageENG-
dc.titleDesign and strength evaluation of an anodically bonded pressurized cavity array for wafer-level MEMS packaging-
dc.typeConference-
dc.identifier.scopusid2-s2.0-0032297029-
dc.type.rimsCONF-
dc.citation.volume66-
dc.citation.beginningpage357-
dc.citation.endingpage360-
dc.citation.publicationnameInter. Mechanical Engineering Congress and Exposition (IMECE '98),-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorCho, Young-Ho-
dc.contributor.nonIdAuthorGo, Jeung Sang-
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BiS-Conference Papers(학술회의논문)
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