Spontaneous emission factor of oxidized VCSELs from the measured below-threshold cavity loss

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dc.contributor.authorShin, JH-
dc.contributor.authorKim, JH-
dc.contributor.authorJu, YG-
dc.contributor.authorShin, HE-
dc.contributor.authorLee, Yong-Hee-
dc.date.accessioned2013-03-15T09:03:00Z-
dc.date.available2013-03-15T09:03:00Z-
dc.date.created2012-02-06-
dc.date.issued1997-
dc.identifier.citationCLEO '97, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/118080-
dc.languageENG-
dc.publisherCLEO-
dc.titleSpontaneous emission factor of oxidized VCSELs from the measured below-threshold cavity loss-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameCLEO '97-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorLee, Yong-Hee-
dc.contributor.nonIdAuthorShin, JH-
dc.contributor.nonIdAuthorKim, JH-
dc.contributor.nonIdAuthorJu, YG-
dc.contributor.nonIdAuthorShin, HE-
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PH-Conference Papers(학술회의논문)
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