A Physically Based High Frequency Noise Model of MESFET's Taking Static Feedback Effect into Account
- Issue Date
- 1995-08
- Language
- ENG
- Citation
22nd Int. Symp. Compound Semiconductors, no.145, pp.725 - 730
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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