In situ stress measurements of Co-based multilayer films
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, YS | ko |
| dc.contributor.author | Shin, Sung-Chul | ko |
| dc.date.accessioned | 2013-03-15T08:04:28Z | - |
| dc.date.available | 2013-03-15T08:04:28Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1995-04-17 | - |
| dc.identifier.citation | 1995 MRS Spring Meeting, pp.285 - 290 | - |
| dc.identifier.issn | 0272-9172 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/117651 | - |
| dc.language | English | - |
| dc.publisher | MRS | - |
| dc.title | In situ stress measurements of Co-based multilayer films | - |
| dc.type | Conference | - |
| dc.identifier.wosid | A1995BE43P00044 | - |
| dc.identifier.scopusid | 2-s2.0-0029533836 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 285 | - |
| dc.citation.endingpage | 290 | - |
| dc.citation.publicationname | 1995 MRS Spring Meeting | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | San Francisco, CA, USA | - |
| dc.contributor.localauthor | Shin, Sung-Chul | - |
| dc.contributor.nonIdAuthor | Kim, YS | - |
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