A new low-loss microstrip structure on LTCC substrate

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dc.contributor.authorLee, YCko
dc.contributor.authorEun, KCko
dc.contributor.authorPark, Chul Soonko
dc.date.accessioned2009-10-09T04:51:56Z-
dc.date.available2009-10-09T04:51:56Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2003-05-
dc.identifier.citationIEICE TRANSACTIONS ON ELECTRONICS, v.E86C, no.5, pp.867 - 869-
dc.identifier.issn0916-8524-
dc.identifier.urihttp://hdl.handle.net/10203/11746-
dc.description.abstractWe have devised and implemented a new low-loss microstrip transmission structure on LTCC substrate by including void cavities in the dielectric layer between conductor strip and ground plane. Measurements of lambda/4 T-resonators with the novel microstrip structure reveal total loss of 0.0126 dB/mm and Q-factor of 267 at 15.85GHz. The dielectric loss is analyzed as small as 0.0005 dB/mm at the frequency, and that is equivalent to an improvement of a factor of 18 compared to the conventional LTCC microstrip structure. The proposed microstrip structure with the embedded void cavities is suited for low loss LTCC based RF-MCM applications.-
dc.description.sponsorshipby the Ministry of Science and Technology of Korea and KISTEP.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG-
dc.titleA new low-loss microstrip structure on LTCC substrate-
dc.typeArticle-
dc.identifier.wosid000183075500031-
dc.identifier.scopusid2-s2.0-0141972357-
dc.type.rimsART-
dc.citation.volumeE86C-
dc.citation.issue5-
dc.citation.beginningpage867-
dc.citation.endingpage869-
dc.citation.publicationnameIEICE TRANSACTIONS ON ELECTRONICS-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorPark, Chul Soon-
dc.contributor.nonIdAuthorLee, YC-
dc.contributor.nonIdAuthorEun, KC-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorvoid cavity-
dc.subject.keywordAuthorLTCC-
dc.subject.keywordAuthorresonator-
dc.subject.keywordAuthormicrostrip line-
dc.subject.keywordAuthordielectric loss-
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