Effects of buffer layer on the fabrication and characteristics of ferroelectric thin films
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Song, HW | ko |
| dc.contributor.author | Lee, JS | ko |
| dc.contributor.author | Kim, DW | ko |
| dc.contributor.author | Kim, KH | ko |
| dc.contributor.author | Sung, TH | ko |
| dc.contributor.author | No, Kwangsoo | ko |
| dc.date.accessioned | 2013-03-15T05:47:00Z | - |
| dc.date.available | 2013-03-15T05:47:00Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1997-11-30 | - |
| dc.identifier.citation | Proceedings of the 1997 MRS Fall Symposium, pp.471 - 476 | - |
| dc.identifier.issn | 0272-9172 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/116771 | - |
| dc.language | English | - |
| dc.publisher | MRS | - |
| dc.title | Effects of buffer layer on the fabrication and characteristics of ferroelectric thin films | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000074085900073 | - |
| dc.identifier.scopusid | 2-s2.0-0031674999 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 471 | - |
| dc.citation.endingpage | 476 | - |
| dc.citation.publicationname | Proceedings of the 1997 MRS Fall Symposium | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Boston, MA, USA | - |
| dc.contributor.localauthor | No, Kwangsoo | - |
| dc.contributor.nonIdAuthor | Song, HW | - |
| dc.contributor.nonIdAuthor | Lee, JS | - |
| dc.contributor.nonIdAuthor | Kim, DW | - |
| dc.contributor.nonIdAuthor | Kim, KH | - |
| dc.contributor.nonIdAuthor | Sung, TH | - |
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