ECR O2-N2O Plasma Thermal Oxide and Its Application to Polysilicon Thin Film Transistors

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dc.contributor.authorChul-Hi Han-
dc.date.accessioned2013-03-15T01:32:17Z-
dc.date.available2013-03-15T01:32:17Z-
dc.date.created2012-02-06-
dc.date.issued1997-
dc.identifier.citation9th Hungarian-Korean Seminar, v., no., pp.241 - 250-
dc.identifier.urihttp://hdl.handle.net/10203/115467-
dc.languageENG-
dc.titleECR O2-N2O Plasma Thermal Oxide and Its Application to Polysilicon Thin Film Transistors-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage241-
dc.citation.endingpage250-
dc.citation.publicationname9th Hungarian-Korean Seminar-
dc.identifier.conferencecountryHungary-
dc.identifier.conferencecountryHungary-
dc.contributor.localauthorChul-Hi Han-
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