High-Resolution Transmission Electron Microscopy of the Interfaces in Materials
- Issue Date
- 1989-10-01
- Language
- KOR
- Citation
3rd Conf. on Materials and Material Properties-Principles and Applications of TEM and XRD, pp.5 - 5
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.