DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ji, C | ko |
dc.contributor.author | Ragan, R | ko |
dc.contributor.author | Kim, Sehun | ko |
dc.contributor.author | Chang, YA | ko |
dc.contributor.author | Chen, Y | ko |
dc.contributor.author | Ohlberg, DAA | ko |
dc.contributor.author | Williams, RS | ko |
dc.date.accessioned | 2009-09-21T01:35:59Z | - |
dc.date.available | 2009-09-21T01:35:59Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-03 | - |
dc.identifier.citation | APPLIED PHYSICS A-MATERIALS SCIENCE PROCESSING, v.80, no.6, pp.1301 - 1304 | - |
dc.identifier.issn | 0947-8396 | - |
dc.identifier.uri | http://hdl.handle.net/10203/11341 | - |
dc.description.abstract | Platinum-induced surface reconstructions on Si( 001) were investigated by scanning tunneling microscopy. The Si( 001) surface shows c( 4 x 6) + c( 4 x 2)-type reconstruction after Pt hot deposition at 750 degrees C. The c( 4 x 2) reconstruction is formed by regular arrangement of Pt ad-atoms at the hollow sites between two Si dimers on Si( 001). The c( 4 x 6) structure is formed by long-range ordering of Si dimers superimposed on the c( 4 x 2) reconstruction. The surface reconstruction changes with the local Pt coverage and missing dimer density. An atomic model for c( 4 x 6)+ c( 4 x 2) is proposed based on the observed c( 4 x 4) surface reconstruction, a new surface reconstruction, which is observed following a high-temperature anneal at 900 degrees C. The c( 4 x 4) surface reconstruction is regular and ordered in both the dimer-row direction and the direction perpendicular to the dimer rows. The reconstruction is formed by the regular arrangement of Si dimers and Pt ad-atoms sitting on top of the hollow sites surrounded by two dimers. An atomic model for this new reconstruction is proposed. | - |
dc.description.sponsorship | the National Science Foundation through Grant No. NSF-DMR-0097621. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | SPRINGER | - |
dc.subject | SCANNING-TUNNELING-MICROSCOPY | - |
dc.subject | DISILICIDE NANOWIRES | - |
dc.subject | DIODES | - |
dc.subject | SI(100) | - |
dc.subject | SI(001) | - |
dc.subject | GROWTH | - |
dc.title | Surface reconstruction of Pt/Si(001) | - |
dc.type | Article | - |
dc.identifier.wosid | 000227696100020 | - |
dc.type.rims | ART | - |
dc.citation.volume | 80 | - |
dc.citation.issue | 6 | - |
dc.citation.beginningpage | 1301 | - |
dc.citation.endingpage | 1304 | - |
dc.citation.publicationname | APPLIED PHYSICS A-MATERIALS SCIENCE PROCESSING | - |
dc.identifier.doi | 10.1007/s00339-004-3150-8 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Sehun | - |
dc.contributor.nonIdAuthor | Ji, C | - |
dc.contributor.nonIdAuthor | Ragan, R | - |
dc.contributor.nonIdAuthor | Chang, YA | - |
dc.contributor.nonIdAuthor | Chen, Y | - |
dc.contributor.nonIdAuthor | Ohlberg, DAA | - |
dc.contributor.nonIdAuthor | Williams, RS | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | SCANNING-TUNNELING-MICROSCOPY | - |
dc.subject.keywordPlus | DISILICIDE NANOWIRES | - |
dc.subject.keywordPlus | DIODES | - |
dc.subject.keywordPlus | SI(100) | - |
dc.subject.keywordPlus | SI(001) | - |
dc.subject.keywordPlus | GROWTH | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.