DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chae, Kyung-Chul | - |
dc.date.accessioned | 2013-03-14T16:33:03Z | - |
dc.date.available | 2013-03-14T16:33:03Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1988 | - |
dc.identifier.citation | Annual Reliability and Maintainability Symposium, v., no., pp.136 - 138 | - |
dc.identifier.uri | http://hdl.handle.net/10203/110792 | - |
dc.language | ENG | - |
dc.title | System Reliability Using Binomial Failure Rate | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 136 | - |
dc.citation.endingpage | 138 | - |
dc.citation.publicationname | Annual Reliability and Maintainability Symposium | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Chae, Kyung-Chul | - |
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