Showing results 1 to 2 of 2
A medium energy ion scattering analysis of the Si-SiO2 interface formed by ion beam oxidation of silicon Kim, YP; Choi, Si-Kyung; Ha, YH; Kim, Sehun; Kim, HK; Moon, DW, APPLIED SURFACE SCIENCE, v.117, pp.207 - 211, 1997-06 |
Graded synthetic approach for the fabrication of nanocrystal quantum dots for enhanced carrier injection in light-emitting diodes Kim, Kyungnam; Han, Chul Jong; Park, Yun Chang; Isnaeni; Cho, Yong-Hoon; Jeong, Sohee, NANOTECHNOLOGY, v.24, no.50, 2013-12 |
Discover