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Measurement of optical loss variation on thickness of InGaN optical confinement layers of blue-violet-emitting laser diodes Son, J. K.; Lee, S. N.; Paek, H. S.; Sakong, T.; Kim, H. K.; Park, Y.; Ryu, H. Y.; et al, JOURNAL OF APPLIED PHYSICS, v.103, no.10, 2008-05 |
(Poster) Spatial investigation between structural properties and exciton dynamics in semipolar (11-22) GaN grown on m-sapphire using thick-SiO2 mask Lee, K. S.; Cho, Yong-Hoon; Jeong, J. C.; Jang, J. J.; Kim, G. H.; Nam, O. H., International Conference on Electronic Materials and Nanotechnology for Green Environment(ENGE2014), ENGE2014, 2014-11-17 |
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