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Structural analysis of thin films of novel polynorbornene derivatives by grazing incidence X-ray scattering and specular X-ray reflectivity along with ellipsometry Lee, TJ; Byun, GS; Jin, KS; Heo, K; Kim, G; Kim, Sang Youl; Cho, I; et al, JOURNAL OF APPLIED CRYSTALLOGRAPHY, v.40, pp.S620 - S625, 2007-04 |
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