Showing results 11 to 13 of 13
SHOT-NOISE-CORRECTED MEASUREMENT OF THE G(2)(0) OF THE SPECKLE BACKSCATTERED FROM A ROTATING RANDOMLY ROUGH METAL-SURFACE AHN, SJ; Kim, Byoung Yoon; LEE, SS, OPTICS LETTERS, v.17, no.5, pp.317 - 319, 1992-03 |
SIMULTANEOUS MEASUREMENT OF ABSORPTION-LINES FOR RIGHT AND LEFT CIRCULARLY POLARIZED FIELDS USING SATURATION SPECTROSCOPY KIM, JB; LEE, JM; KIM, JS; Kong, Hong-Jin; LEE, SS, OPTICS LETTERS, v.16, no.7, pp.511 - 513, 1991-04 |
THIN-FILM TRANSISTORS WITH POLYCRYSTALLINE SILICON PREPARED BY A NEW ANNEALING METHOD NAM, KS; SONG, YH; BAEK, JT; Kong, Hong-Jin; LEE, SS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.32, no.5A, pp.1908 - 1912, 1993-05 |
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