Showing results 2 to 4 of 4
Electronic structure of oxygen-vacancy defects in amorphous In-Ga-Zn-O semiconductors Noh, Hyeon-Kyun; Chang, Kee-Joo; Ryu, Byung-Ki; Lee, Woo-Jin, PHYSICAL REVIEW B, v.84, no.11, pp.115205 - 115205, 2011-09 |
Source of instability at the amorphous interface between InGaZnO4 and SiO2: A theoretical investigation Song, Hochul; Kang, Youngho; Nahm, Ho Hyun; Han, Seungwu, PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, v.252, no.8, pp.1872 - 1876, 2015-08 |
Subgap States near the Conduction-Band Edge Due to Undercoordinated Cations in Amorphous In-Ga-Zn-O and Zn-Sn-O Semiconductors Han, Woo Hyun; Chang, Kee Joo, PHYSICAL REVIEW APPLIED, v.6, no.4, pp.044011 - 044011, 2016-10 |
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