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Cutoff probe using Fourier analysis for electron density measurement Na, Byung-Keun; You, Kwang-Ho; Kim, Dae-Woong; Chang, Hong-Young; You, Shin-Jae; Kim, Jung-Hyung, REVIEW OF SCIENTIFIC INSTRUMENTS, v.83, no.1, 2012-01 |
Fast measurement of a pulsed plasma using a Fourier cutoff probe Na, Byung-Keun; You, Kwang-Ho; Kim, D. -W.; Seo, Byong-Hoon; Chang, Hong-Young; You, S. -J.; Lee, Yun-Seong, JOURNAL OF INSTRUMENTATION, v.7, 2012-04 |
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