A Stepwise Refinement Data Path Synthesis Procedure for Easy Testability
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Taewhan Kim | - |
| dc.date.accessioned | 2013-03-14T15:01:24Z | - |
| dc.date.available | 2013-03-14T15:01:24Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1994 | - |
| dc.identifier.citation | IEEE European Design and Test Conference (EDAC), v., no., pp.586 - 590 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/109970 | - |
| dc.language | ENG | - |
| dc.title | A Stepwise Refinement Data Path Synthesis Procedure for Easy Testability | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 586 | - |
| dc.citation.endingpage | 590 | - |
| dc.citation.publicationname | IEEE European Design and Test Conference (EDAC) | - |
| dc.identifier.conferencecountry | France | - |
| dc.identifier.conferencecountry | France | - |
| dc.contributor.localauthor | Taewhan Kim | - |
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