Allowable Surface Silicon Thickness for Fully-depleted SOI MOSFET's
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choochon Lee | - |
| dc.date.accessioned | 2013-03-14T14:13:26Z | - |
| dc.date.available | 2013-03-14T14:13:26Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1991 | - |
| dc.identifier.citation | Proc.IEEE SOI Conf.,, v., no., pp.56 - 57 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/109567 | - |
| dc.language | ENG | - |
| dc.title | Allowable Surface Silicon Thickness for Fully-depleted SOI MOSFET's | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 56 | - |
| dc.citation.endingpage | 57 | - |
| dc.citation.publicationname | Proc.IEEE SOI Conf., | - |
| dc.contributor.localauthor | Choochon Lee | - |
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