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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

A New Evaluation of the Activation Energy for Interface State Generation due to Hot-Carrier Effects

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Lee, Kwyroresearcher / Kim, Shi-Ho / Min, Kyeong-Sik
Issue Date
1993
Language
ENG
Citation

Technical Digest of 3rd International Conference on VLSI and CAD, pp.90 - 92

URI
http://hdl.handle.net/10203/109211
Appears in Collection
EE-Conference Papers(학술회의논문)
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