A Model of Thin Oxide Damage by Plasma Etching and Ashing Processes
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hyung-Cheol Shin | - |
| dc.date.accessioned | 2013-03-14T10:21:29Z | - |
| dc.date.available | 2013-03-14T10:21:29Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1991 | - |
| dc.identifier.citation | Plasma Etch, v., no., pp.27 - 29 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/107748 | - |
| dc.language | ENG | - |
| dc.title | A Model of Thin Oxide Damage by Plasma Etching and Ashing Processes | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 27 | - |
| dc.citation.endingpage | 29 | - |
| dc.citation.publicationname | Plasma Etch | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Hyung-Cheol Shin | - |
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