DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김주태 | - |
dc.contributor.author | 장태호 | - |
dc.contributor.author | 김현배 | - |
dc.contributor.author | 김남윤 | - |
dc.contributor.author | 박희균 | - |
dc.contributor.author | 우성일 | - |
dc.date.accessioned | 2013-03-14T08:36:40Z | - |
dc.date.available | 2013-03-14T08:36:40Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1993-01 | - |
dc.identifier.citation | Conf. on Semiconductor Materials, Components and Computer Aided Design, Spring Symp., KITE, v.11, no.1, pp.293 - 296 | - |
dc.identifier.uri | http://hdl.handle.net/10203/107070 | - |
dc.language | ENG | - |
dc.publisher | 대한전자공학회 | - |
dc.title | New-Fine patterning method of positive photoresist by silylation/ wet develop | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.volume | 11 | - |
dc.citation.issue | 1 | - |
dc.citation.beginningpage | 293 | - |
dc.citation.endingpage | 296 | - |
dc.citation.publicationname | Conf. on Semiconductor Materials, Components and Computer Aided Design, Spring Symp., KITE | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | 우성일 | - |
dc.contributor.nonIdAuthor | 김주태 | - |
dc.contributor.nonIdAuthor | 장태호 | - |
dc.contributor.nonIdAuthor | 김현배 | - |
dc.contributor.nonIdAuthor | 김남윤 | - |
dc.contributor.nonIdAuthor | 박희균 | - |
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