DC Field | Value | Language |
---|---|---|
dc.contributor.author | Eo, K.S. | - |
dc.contributor.author | Kyung, Chong-Min | - |
dc.date.accessioned | 2013-03-14T06:50:45Z | - |
dc.date.available | 2013-03-14T06:50:45Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1985-06 | - |
dc.identifier.citation | 1985 International Symposium on Circuits and Systems - Proceedings., v., no., pp.1289 - 1292 | - |
dc.identifier.issn | 0271-4310 | - |
dc.identifier.uri | http://hdl.handle.net/10203/106285 | - |
dc.language | ENG | - |
dc.publisher | 1985 International Symposium on Circuits and Systems - Proceedings. | - |
dc.title | NEW DESIGN RULE CHECKER BASED ON CORNER CHECKING AND BIT MAPPING | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-0022307102 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1289 | - |
dc.citation.endingpage | 1292 | - |
dc.citation.publicationname | 1985 International Symposium on Circuits and Systems - Proceedings. | - |
dc.identifier.conferencecountry | Japan | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Kyung, Chong-Min | - |
dc.contributor.nonIdAuthor | Eo, K.S. | - |
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