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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

X-ray irradiation induced damage in MOS structures and it's effect on oxide reliability

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dc.contributor.authorLee, Kwyro-
dc.contributor.authorHan, Chul-Hi-
dc.contributor.authorKim, Shi-Ho-
dc.contributor.authorLee, Ho-Jun-
dc.contributor.authorChoi, Sang-Soo-
dc.contributor.authorJeon, Young-Jin-
dc.contributor.authorFabrizio, Enzo Di-
dc.contributor.authorGentili, Massimo-
dc.date.accessioned2013-03-14T06:05:36Z-
dc.date.available2013-03-14T06:05:36Z-
dc.date.created2012-02-06-
dc.date.issued1993-
dc.identifier.citationTechnical Digest of 3rd International Conference on VLSI and CAD, v., no., pp.20 - 23-
dc.identifier.urihttp://hdl.handle.net/10203/105964-
dc.languageENG-
dc.titleX-ray irradiation induced damage in MOS structures and it's effect on oxide reliability-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage20-
dc.citation.endingpage23-
dc.citation.publicationnameTechnical Digest of 3rd International Conference on VLSI and CAD-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorLee, Kwyro-
dc.contributor.localauthorHan, Chul-Hi-
dc.contributor.nonIdAuthorKim, Shi-Ho-
dc.contributor.nonIdAuthorLee, Ho-Jun-
dc.contributor.nonIdAuthorChoi, Sang-Soo-
dc.contributor.nonIdAuthorJeon, Young-Jin-
dc.contributor.nonIdAuthorFabrizio, Enzo Di-
dc.contributor.nonIdAuthorGentili, Massimo-
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EE-Conference Papers(학술회의논문)
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